Apek Mulay is a senior analyst in US Semiconductor Industry. He pursued undergraduate studies in electronics engineering at the University of Mumbai in India and completed his master's degree in EE at Texas Tech University, Lubbock. He is the sole author of the patent "Surface Imaging with Materials Identified by Colors," and he has chaired technical sessions of the International Symposium for Testing and Failure Analysis. He is a contributor to the EDFAS international journal and has authored several articles on the US economy, economic policy analysis, supply chain, trade deficits, budget deficits, the sustainable economy, reforms in democracy, and mass capitalism. He is USCIS approved for US permanent residency under the category of foreign nationals with extraordinary abilities in science and technologies. He contributes to recognized publications such as EBN, Semiwiki, Truth-out.org, and the electronics.ca research network. He also runs a well visited and informative blog to bring Social, Political, Economic and Spiritual Change in this world. www.apekmulay.com.